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1. Bobrovich, O.G., Mikhalkovich, O.M., Tashlykov I.S. Composition and morphology of Ti and W coatings deposited on silicon during ion beam assistance // Inorganic Materials: Applied Research, 2015, ? Vol. 6, No. 3, ? §². 229¨C233.

2. I.S. Tashlykov, O.G. Bobrovich Radiation damage of Si wafers modified by means of thin layer ion assisted deposition // Vacuum. ¨C 2005. ¨C Vol. 78, Issue 2-4. ¨C pp. 337-340.

3. §°.§¤.§¢§à§Ò§â§à§Ó§Ú§é, §ª.§³.§´§Ñ§ê§Ý§í§Ü§à§Ó, §£.§£.§´§å§Ý§î§Ö§Ó, §³.§®.§¢§Ñ§â§Ñ§Û§ê§å§Ü §ª§Ù§å§é§Ö§ß§Ú§Ö §ñ§Õ§Ö§â§ß§à-§æ§Ú§Ù§Ú§é§Ö§ã§Ü§Ú§Þ§Ú §Þ§Ö§ä§à§Õ§Ñ§Þ§Ú §Þ§Ö§ä§Ñ§Ý§Ý§à§ã§à§Õ§Ö§â§Ø§Ñ§ë§Ú§ç (Ti, Co)-§á§à§Ü§â§í§ä§Ú§Û, §à§ã§Ñ§Ø§Õ§Ö§ß§ß§í§ç §Þ§Ö§ä§à§Õ§à§Þ §Ú§à§ß§ß§à§Ô§à §Ñ§ã§ã§Ú§ã§ä§Ú§â§à§Ó§Ñ§ß§Ú§ñ §ß§Ñ §Ü§â§Ö§Þ§ß§Ú§Û // §¶§Ú§Ù§Ú§Ü§Ñ §Ú §ç§Ú§Þ§Ú§ñ §à§Ò§â§Ñ§Ò§à§ä§Ü§Ú §Þ§Ñ§ä§Ö§â§Ú§Ñ§Ý§à§Ó. - 2006. ¡í1 §³. 54?58.

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